DOC: ADVANCED TOOLS FOR NANOSCOPIC MATERIALS CHARACTERIZATION


Dr. A.K.Raychaudhuri (AKR) SNBNCBS,India Nanolithography and Nanofabrication using Dual Beam microscopes Dr. K. Mu raleedharan (KM) CGC R I,India TEM of interfaces and grain boundaries Dr. N. Ravishankar (NR) IISc,India TE M of nanomaterials Dr. Vikram Jayram (VJ) IISc, India SEM fundamentals and examples of some advanced applications Dr. Daniel Phifer (DP) FEI, Netherlands Find Answers that change the World with FEI’s Latest Innovation in SEM, Dual beam and TEM... Document/File: .pdf, filesize: n/a. Filetype: pdf. Filename: advanced-tools-for-nanoscopic-materials-characterization. Title: Advanced Tools for Nanoscopic Materials Characterization. 2014.

 

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